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November 22, 2003
Modeling error discovery as failure
[8.2.1.5. Empirical model fitting - distribution free (Kaplan-Meier)
approach] In a random search for errors, one can model the probability of finding an error using methods for modeling the probability of failing. The K-M approach uses emperical data to generate a piece-wise model of failure probability as a function of time. The nice thing about K-M is that you do not need to claim that the data do or do not follow a particular distribution.
Posted by jones at November 22, 2003 09:01 PM
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